More Speakers Added To Particle Summit Program


Aug 26, 2010

Additional speakers have been added to the roster for the upcoming Particle Summit, which takes place Oct. 20-21, 2010, at The Charles Hotel, Cambridge, Mass.
Dr. Joerg Bolze from analytical X-ray company PANalytical will discuss Nanoparticle size distribution determination by small-angle X-ray scattering on a multi-purpose X-ray diffractometer platform. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nano-particle dispersions, nano-powders, and nano-composites.

Alon Vaisman from Malvern Instruments will present Particle sizing -- a proven technology for process control, in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.

The event, which is sponsored by Malvern Instruments, also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.
For more information, visit

Show Comments
Hide Comments

Join the discussion

We welcome your thoughtful comments.
All comments will display your user name.

Want to participate in the discussion?

Register for free

Log in for complete access.


No one has commented on this page yet.

RSS feed for comments on this page | RSS feed for all comments