Probes Include Flexible Time Delays For Covered And Uncovered Conditions

Sept. 7, 2010
he dual-timer capacitance probe is suited for applications when it is essential for the probe to alert immediately to a covered state when used for high-level detection.

BinMaster’s Level Controls introduces dual-timer capacitance probes that feature a flexible time delay for covered and uncovered conditions. This feature allows the user to set a probe to react either immediately or with up to a 30-second delay when it detects a covered or uncovered state. For example, the capacitance probe can be set to send an immediate alert when it reaches a covered state but can be set to alert with a 15-second delay when it detects an uncovered state.

The dual-timer capacitance probe is suited for applications when it is essential for the probe to alert immediately to a covered state when used for high-level detection, as in situations when the probe is used to shut off a filling process. When the probe reaches an uncovered state, that same probe can be set to alert with a selectable one-second to 30-second delay. An immediate alert or timed delay can be applied to either the covered or uncovered condition and is available on both the Procap I and Procap II capacitance probes.

Procap I and II capacitance probes are designed to offer interference-free, fail-safe operation and “quick-set” calibration. BinMaster’s capacitance sensors are used for high- and low-level detection in bins, silos, tanks, hoppers, chutes and other vessels used for material storage or process manufacturing. BinMaster Procap I and II capacitance probes are designed to provide interference-free operation – working below the RF level of 9 KHz at just 6 KHz.

It’s also designed to not interfere with two-way radios or other equipment operating in the radio spectrum. An assortment of probes and extensions make these capacitance probes appropriate for a variety of solid, liquid and slurry materials.The dual-timer capacitance probe was designed for customers who requested flexibility in setting time delays for covered versus uncovered conditions in a capacitance probe.

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