IOtech has added two new products to the offering of data acquisition system solutions. Following in the tradition of the ZonicBook/618E, the IOtech 640e and 650e Series DSAs establishes a new benchmark for shock and vibration monitoring, NVH measurements and rotating machinery analysis.
Like the IOtech 600 USB Series, both Ethernet models have total harmonic distortion of 100dB, 24-bit ADC per channel analog inputs and 8-bit digital I/O ports. Any of the four inputs on the IOtech 640e and five inputs on the IOtech 650e may be used to measure acceleration, velocity, proximity, pressure and tachometer signals. Other features include tight channel-to-channel phase matching, TEDS and IEPE source support on the first four channels and selectable AC/DC coupling.
Four software packages are available for the IOtech 600e Series DSA, each tailored to a particular type of vibration measurement and analysis applications.
eZ-Analyst provides throughput data recording and multiple channel vibration analyses. Time Waveform, Spectrum, Waterfall, FRF, Cross, Transfer Function, Coherence and Octave analyses is provided. Direct export to the most accepted Modal Analysis packages, ME Scope and Star Modal is supported.
eZ-TOMAS provides on-line vibration measurement, limit checking, transient data storage, and rotating-machinery analyses. Time Waveform, Spectrum, Waterfall, Orbit, Polar, Bode, Shaft Center Line and Trend analyses are provided. Data storage can be triggered based on user defined triggers and limit settings. Limit settings can be learned using machine condition.
eZ-Balance is used to balance rotating machinery with up to seven planes. A Toolkit, which includes Split Weight calculations, supports the balance process. The vibration vectors and correction weights are displayed on polar displays. Time and spectrum plots show the detailed vibration measurements during the balancing process.
eZ-NDT is used in production applications to determine the quality of production products. Resonance inspection provides a measure of quality. Spectral limit criteria can be learned by comparing known good and bad samples. Production rates of one part per second are supported.
