Emerson Process Management Wins Frost & Sullivan Customer Value Award

Source: ChemicalProcessing.com

Apr 12, 2010

Frost & Sullivan has named Emerson Process Management the winner of its 2009 Latin America Customer Value Enhancement Award in Industrial Process Control.  Emerson was chosen for successfully linking the capabilities of its Smart Wireless technology to practical business improvements for its customers.

The award was among those presented by Frost & Sullivan at its recent Latin America Best Practices Excellence ceremony in Sao Paulo, Brazil.  Winning companies were recognized as "best of breed" for their industry leadership, innovative strategies, and performance.

"We analyzed several automation companies in depth to select the 2009 winner for customer value enhancement," explained Frost & Sullivan director Fernando Serra.  "Among other factors, we considered technology leadership, market development, and benefits to end users.  Emerson's selection clearly reflects the ability of its products and practices to help customers generate value."

Emerson's Smart Wireless technology extends the benefits of its PlantWeb digital plant architecture to areas that were previously out of technical or economic reach. This easy, affordable access to additional information helps customers gain better understanding and control of their processes for better business results.

Pedro D'Ascola, vice president and general manager for Emerson Process Management in Brazil, accepted the award.  "We share Frost & Sullivan's view that technology is only as important as the business value it provides," said D'Ascola, "and we are honored to be chosen as the best in delivering that value to customers."

For more information, visit: http://www2.emersonprocess.com.

Show Comments
Hide Comments

Join the discussion

We welcome your thoughtful comments.
All comments will display your user name.

Want to participate in the discussion?

Register for free

Log in for complete access.


No one has commented on this page yet.

RSS feed for comments on this page | RSS feed for all comments